| # | Title | Journal | Year | Citations |
|---|
| 1 | Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids | Surface and Interface Analysis | 1979 | 4,948 |
| 2 | Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds | Surface and Interface Analysis | 2004 | 2,742 |
| 3 | Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50-2000 eV range | Surface and Interface Analysis | 1994 | 2,216 |
| 4 | Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis | Surface and Interface Analysis | 1981 | 1,918 |
| 5 | X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems | Surface and Interface Analysis | 2009 | 1,307 |
| 6 | Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50-2000 eV range | Surface and Interface Analysis | 1991 | 1,161 |
| 7 | Advanced analysis of copper X‐ray photoelectron spectra | Surface and Interface Analysis | 2017 | 1,040 |
| 8 | Surface Oxidation and Reduction of CuO and Cu2O Studied Using XPS and XAES | Surface and Interface Analysis | 1996 | 926 |
| 9 | Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz) | Surface and Interface Analysis | 2008 | 910 |
| 10 | Calculations of electron inelastic mean free paths for 31 materials | Surface and Interface Analysis | 1988 | 903 |
| 11 | Structure and physicochemistry of anodic oxide films on titanium and TA6V alloy | Surface and Interface Analysis | 1999 | 811 |
| 12 | Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method | Surface and Interface Analysis | 1998 | 776 |
| 13 | Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range | Surface and Interface Analysis | 2011 | 746 |
| 14 | Resolving ruthenium: XPS studies of common ruthenium materials | Surface and Interface Analysis | 2015 | 719 |
| 15 | Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50-2000 eV range | Surface and Interface Analysis | 1991 | 624 |
| 16 | XPS Study of the reduction of cerium dioxide | Surface and Interface Analysis | 1993 | 563 |
| 17 | XPS O 1s binding energies for polymers containing hydroxyl, ether, ketone and ester groups | Surface and Interface Analysis | 1991 | 554 |
| 18 | An ESCA method for determining the oxide thickness on aluminum alloys | Surface and Interface Analysis | 1990 | 512 |
| 19 | X-ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides | Surface and Interface Analysis | 1992 | 501 |
| 20 | Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments | Surface and Interface Analysis | 1997 | 500 |
| 21 | XPS study of supported gold catalysts: the role of Au0 and Au+δ species as active sites | Surface and Interface Analysis | 2006 | 435 |
| 22 | Quantitative analysis of the inelastic background in surface electron spectroscopy | Surface and Interface Analysis | 1988 | 423 |
| 23 | X-ray photoelectron spectroscopy studies of chromium compounds | Surface and Interface Analysis | 2004 | 419 |
| 24 | The quantitative analysis of surfaces by XPS: A review | Surface and Interface Analysis | 1980 | 404 |
| 25 | Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP-2M IMFP predictive equation | Surface and Interface Analysis | 2003 | 403 |
| 26 | Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV | Surface and Interface Analysis | 1993 | 397 |
| 27 | Adventitious carbon?the panacea for energy referencing? | Surface and Interface Analysis | 1982 | 394 |
| 28 | XPS of sulphide mineral surfaces: metal-deficient, polysulphides, defects and elemental sulphur | Surface and Interface Analysis | 1999 | 352 |
| 29 | Raman spectroscopy of GaN, AlGaN and AlN for process and growth monitoring/control | Surface and Interface Analysis | 2001 | 327 |
| 30 | Deconvolution as a correction for photoelectron inelastic energy losses in the core level XPS spectra of iron oxides | Surface and Interface Analysis | 1987 | 323 |
| 31 | Auger parameter measurements of zinc compounds relevant to zinc transport in the environment | Surface and Interface Analysis | 1989 | 316 |
| 32 | XPS determination of oxygen-containing functional groups on carbon-fibre surfaces and the cleaning of these surfaces | Surface and Interface Analysis | 1990 | 309 |
| 33 | Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering | Surface and Interface Analysis | 2001 | 307 |
| 34 | Universality Classes of Inelastic Electron Scattering Cross-sections | Surface and Interface Analysis | 1997 | 306 |
| 35 | Electron transport in solids for quantitative surface analysis | Surface and Interface Analysis | 2001 | 303 |
| 36 | Stoichiometric vanadium oxides studied by XPS | Surface and Interface Analysis | 2012 | 301 |
| 37 | Differentiating calcium carbonate polymorphs by surface analysis techniques—an XPS and TOF‐SIMS study | Surface and Interface Analysis | 2008 | 297 |
| 38 | Quantitative depth profiling in surface analysis: A review | Surface and Interface Analysis | 1980 | 292 |
| 39 | The electronic structure of iridium and its oxides | Surface and Interface Analysis | 2016 | 288 |
| 40 | Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images | Surface and Interface Analysis | 2004 | 277 |
| 41 | Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm | Surface and Interface Analysis | 2015 | 270 |
| 42 | XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies | Surface and Interface Analysis | 1984 | 269 |
| 43 | Systematic x-ray photoelectron spectroscopic study of La1?xSrx-based perovskite-type oxides | Surface and Interface Analysis | 2002 | 268 |
| 44 | XPS analysis of aluminum nitride films deposited by plasma source molecular beam epitaxy | Surface and Interface Analysis | 2008 | 268 |
| 45 | Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape | Surface and Interface Analysis | 1998 | 267 |
| 46 | XPS: binding energy calibration of electron spectrometers 5?re-evaluation of the reference energies | Surface and Interface Analysis | 1998 | 264 |
| 47 | A new examination of secondary electron yield data | Surface and Interface Analysis | 2005 | 258 |
| 48 | Comparison between XPS‐ and FTIR‐analysis of plasma‐treated polypropylene film surfaces | Surface and Interface Analysis | 2008 | 254 |
| 49 | Surface modification of polyester by oxygen‐ and nitrogen‐plasma treatment | Surface and Interface Analysis | 2008 | 249 |
| 50 | Oxidation of magnesium | Surface and Interface Analysis | 2002 | 248 |
