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Top Articles

#TitleJournalYearCitations
1EMS - a software package for electron diffraction analysis and HREM image simulation in materials scienceUltramicroscopy19871,975
2Quantitative measurement of displacement and strain fields from HREM micrographsUltramicroscopy19981,930
3In situ site-specific specimen preparation for atom probe tomographyUltramicroscopy20071,398
4An improved ptychographical phase retrieval algorithm for diffractive imagingUltramicroscopy20091,118
53D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomographyUltramicroscopy2003964
6High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopyUltramicroscopy2013843
7High-resolution Z-contrast imaging of crystalsUltramicroscopy1991836
8Structure of purple membrane from halobacterium halobium: recording, measurement and evaluation of electron micrographs at 3.5 Å resolutionUltramicroscopy1986744
9Development of a 500 Å spatial resolution light microscopeUltramicroscopy1984725
10The ASTRA Toolbox: A platform for advanced algorithm development in electron tomographyUltramicroscopy2015652
11Double conical beam-rocking system for measurement of integrated electron diffraction intensitiesUltramicroscopy1994647
12Use of multivariate statistics in analysing the images of biological macromoleculesUltramicroscopy1981610
13Towards sub-Å electron beamsUltramicroscopy1999567
14Probe retrieval in ptychographic coherent diffractive imagingUltramicroscopy2009556
15High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivityUltramicroscopy2006555
16Angular reconstitution: A posteriori assignment of projection directions for 3D reconstructionUltramicroscopy1987520
17Grain detection from 2d and 3d EBSD data—Specification of the MTEX algorithmUltramicroscopy2011489
18Z-contrast stem for materials scienceUltramicroscopy1989486
19Spectrum-image: The next step in EELS digital acquisition and processingUltramicroscopy1989477
20Towards automated diffraction tomography: Part I—Data acquisitionUltramicroscopy2007452
21Oxidation state and chemical shift investigation in transition metal oxides by EELSUltramicroscopy2012445
22Three-dimensional reconstruction of single particles embedded in iceUltramicroscopy1992437
23A robust algorithm for the reconstruction of helical filaments using single-particle methodsUltramicroscopy2000433
24Incoherent imaging using dynamically scattered coherent electronsUltramicroscopy1999408
25The ribosome at improved resolution: New techniques for merging and orientation refinement in 3D cryo-electron microscopy of biological particlesUltramicroscopy1994385
26CRISP: crystallographic image processing on a personal computerUltramicroscopy1992381
27A spherical-aberration-corrected 200kV transmission electron microscopeUltramicroscopy1998381
28Digital image processing: The semper systemUltramicroscopy1979378
29Dynamics of annular bright field imaging in scanning transmission electron microscopyUltramicroscopy2010373
30Quantitative electron probe microanalysis of biological thin sections: Methods and validityUltramicroscopy1976372
31Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopyUltramicroscopy1996356
32Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscopeUltramicroscopy2012349
33Conditions and reasons for incoherent imaging in STEMUltramicroscopy1996348
34Phase contrast STEM for thin samples: Integrated differential phase contrastUltramicroscopy2016339
35A cantilever array-based artificial noseUltramicroscopy2000335
36Simulation of annular dark field stem images using a modified multislice methodUltramicroscopy1987333
37Similarity measures between imagesUltramicroscopy1987331
38A procedure for quantification of precipitate microstructures from three-dimensional atom probe dataUltramicroscopy2003327
39Environmental high resolution electron microscopy and applications to chemical scienceUltramicroscopy1997324
40An analytical reflection and emission UHV surface electron microscopeUltramicroscopy1985321
41Sample preparation for atomic-resolution STEM at low voltages by FIBUltramicroscopy2012321
42Some comments on models for field enhancementUltramicroscopy2003315
43The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy1975313
44Wetting study of patterned surfaces for superhydrophobicityUltramicroscopy2007310
45Atomic force microscopy study of the antibacterial effects of chitosans on Escherichia coli and Staphylococcus aureusUltramicroscopy2008306
46Electron energy-loss spectrum-imagingUltramicroscopy1991304
47Double-tilt electron tomographyUltramicroscopy1995303
48Atomic-scale electron microscopy at ambient pressureUltramicroscopy2008302
49Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopyUltramicroscopy2014300
50Strategies for fabricating atom probe specimens with a dual beam FIBUltramicroscopy2005297