IEEE Transactions on Nuclear Science

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27.0K(top 1%)

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375.5K(top 1%)

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157(top 2%)

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1.9(top 50%)

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31.6K

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401.4K

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Top Articles

#	Title	Journal	Year	Citations
1	Geant4 developments and applications	IEEE Transactions on Nuclear Science	2006	4,869
2	The Fourier reconstruction of a head section	IEEE Transactions on Nuclear Science	1974	1,680
3	A Method for Attenuation Correction in Radionuclide Computed Tomography	IEEE Transactions on Nuclear Science	1978	1,063
4	Upset hardened memory design for submicron CMOS technology	IEEE Transactions on Nuclear Science	1996	923
5	Basic mechanisms and modeling of single-event upset in digital microelectronics	IEEE Transactions on Nuclear Science	2003	910
6	Cerium-doped lutetium oxyorthosilicate: a fast, efficient new scintillator	IEEE Transactions on Nuclear Science	1992	736
7	Radiation Effects in MOS Oxides	IEEE Transactions on Nuclear Science	2008	676
8	Total ionizing dose effects in MOS oxides and devices	IEEE Transactions on Nuclear Science	2003	672
9	Analytic 3D image reconstruction using all detected events	IEEE Transactions on Nuclear Science	1989	661
10	Medipix2: A 64-k pixel readout chip with 55-/spl mu/m square elements working in single photon counting mode	IEEE Transactions on Nuclear Science	2002	634
11	A Can0nical Integrati0n Technique	IEEE Transactions on Nuclear Science	1983	573
12	Review of displacement damage effects in silicon devices	IEEE Transactions on Nuclear Science	2003	568
13	Collection of Charge on Junction Nodes from Ion Tracks	IEEE Transactions on Nuclear Science	1982	565
14	Importance of input data normalization for the application of neural networks to complex industrial problems	IEEE Transactions on Nuclear Science	1997	558
15	MicroPET: a high resolution PET scanner for imaging small animals	IEEE Transactions on Nuclear Science	1997	557
16	A Framework for Understanding Radiation-Induced Interface States in SiO2 MOS Structures	IEEE Transactions on Nuclear Science	1980	532
17	CREME96: A Revision of the Cosmic Ray Effects on Micro-Electronics Code	IEEE Transactions on Nuclear Science	1997	516
18	Total-Ionizing-Dose Effects in Modern CMOS Technologies	IEEE Transactions on Nuclear Science	2006	511
19	Recent progress in CdTe and CdZnTe detectors	IEEE Transactions on Nuclear Science	2001	508
20	Impact of CMOS technology scaling on the atmospheric neutron soft error rate	IEEE Transactions on Nuclear Science	2000	489
21	Measuring PET scanner sensitivity: relating countrates to image signal-to-noise ratios using noise equivalents counts	IEEE Transactions on Nuclear Science	1990	479
22	Single event upset at ground level	IEEE Transactions on Nuclear Science	1996	478
23	Non-proportionality in the scintillation response and the energy resolution obtainable with scintillation crystals	IEEE Transactions on Nuclear Science	1995	474
24	Damage correlations in semiconductors exposed to gamma, electron and proton radiations	IEEE Transactions on Nuclear Science	1993	464
25	Photoabsorption effects in low temperature electron-irradiated Germanium	IEEE Transactions on Nuclear Science	1974	454
26	New, faster, image-based scatter correction for 3D PET	IEEE Transactions on Nuclear Science	2000	454
27	A tutorial on art (algebraic reconstruction techniques)	IEEE Transactions on Nuclear Science	1974	436
28	A Multicrystal Two Dimensional BGO Detector System for Positron Emission Tomography	IEEE Transactions on Nuclear Science	1986	399
29	Correlating the Radiation Response of MOS Capacitors and Transistors	IEEE Transactions on Nuclear Science	1984	371
30	Absolute light output of scintillators	IEEE Transactions on Nuclear Science	1997	368
31	The nature of the trapped hole annealing process	IEEE Transactions on Nuclear Science	1989	366
32	Radiation Effects on Silica-Based Optical Fibers: Recent Advances and Future Challenges	IEEE Transactions on Nuclear Science	2013	366
33	The ECAT HRRT: performance and first clinical application of the new high resolution research tomograph	IEEE Transactions on Nuclear Science	2002	364
34	Radiation effects in SOI technologies	IEEE Transactions on Nuclear Science	2003	353
35	Radiation-induced edge effects in deep submicron CMOS transistors	IEEE Transactions on Nuclear Science	2005	348
36	Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse Voltages	IEEE Transactions on Nuclear Science	1968	345
37	A measurement of the light yield of common inorganic scintillators	IEEE Transactions on Nuclear Science	1988	345
38	Charge Collection and Charge Sharing in a 130 nm CMOS Technology	IEEE Transactions on Nuclear Science	2006	336
39	Single-event effects in avionics	IEEE Transactions on Nuclear Science	1996	327
40	Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects	IEEE Transactions on Nuclear Science	1999	321
41	Unipolar charge sensing with coplanar electrodes-application to semiconductor detectors	IEEE Transactions on Nuclear Science	1995	319
42	Physical Mechanisms Contributing to Device "Rebound"	IEEE Transactions on Nuclear Science	1984	317
43	Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground	IEEE Transactions on Nuclear Science	2004	315
44	3-D phantom to simulate cerebral blood flow and metabolic images for PET	IEEE Transactions on Nuclear Science	1990	308
45	'Border traps' in MOS devices	IEEE Transactions on Nuclear Science	1992	306
46	ITS: the integrated TIGER series of electron/photon transport codes-Version 3.0	IEEE Transactions on Nuclear Science	1992	305
47	Needs, Trends, and Advances in Inorganic Scintillators	IEEE Transactions on Nuclear Science	2018	305
48	Time of flight in PET revisited	IEEE Transactions on Nuclear Science	2003	302
49	Multiple hit readout of a microchannel plate detector with a three-layer delay-line anode	IEEE Transactions on Nuclear Science	2002	300
50	Single Event Transients in Digital CMOS—A Review	IEEE Transactions on Nuclear Science	2013	298

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