1.3K(top 11%)
articles
13.7K(top 14%)
citations
200(top 12%)
★★ articles
5(top 12%)
★★★ articles
2.2(top 27%)
Avg IF
45(top 17%)
H-Index
79(top 16%)
G-Index
224
journals

Most Cited Articles of TSMC

TitleJournalYearCitations
Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor InSeNano Letters2018293
Algorithmic Design of CMOS LNAs and PAs for 60-GHz RadioIEEE Journal of Solid-State Circuits2007289
Effect of Top Electrode Material on Resistive Switching Properties of $\hbox{ZrO}_{2}$ Film Memory DevicesIEEE Electron Device Letters2007262
Falling in love with online games: The uses and gratifications perspectiveComputers in Human Behavior2010225
De-embedding transmission line measurements for accurate modeling of IC designsIEEE Transactions on Electron Devices2006193
Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applicationsMicroscopy and Microanalysis2005188
One-Step Reduction and Functionalization of Graphene Oxide with Phosphorus-Based Compound to Produce Flame-Retardant Epoxy NanocompositeIndustrial & Engineering Chemistry Research2012172
Pi-Gate SOI MOSFETIEEE Electron Device Letters2001168
Enhancing Frequency Response Control by DFIGs in the High Wind Penetrated Power SystemsIEEE Transactions on Power Systems2011149
High-Quality Interface in ${\rm Al}_{2}{\rm O}_{3}/{\rm GaN}/{\rm GaN}/{\rm AlGaN}/{\rm GaN}$ MIS Structures With In Situ Pre-Gate Plasma NitridationIEEE Electron Device Letters2013134
A hybrid of genetic algorithm and particle swarm optimization for solving bi-level linear programming problem – A case study on supply chain modelApplied Mathematical Modelling2011127
Label-Free SERS Selective Detection of Dopamine and Serotonin Using Graphene-Au Nanopyramid HeterostructureAnalytical Chemistry2015118
45nm low power CMOS logic compatible embedded STT MRAM utilizing a reverse-connection 1T/1MTJ cell2009114
5nm-gate nanowire FinFET2004105
An experimentally validated analytical model for gate line-edge roughness (LER) effects on technology scalingIEEE Electron Device Letters2001103
Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data SetsIEEE Transactions on Semiconductor Manufacturing201593
On the interface state density at In0.53Ga0.47As/oxide interfacesApplied Physics Letters200989
Effects of multiwalled carbon nanotubes functionalization on the morphology and mechanical and thermal properties of carbon fiber/vinyl ester compositesACS Applied Materials & Interfaces201388
Discrete Dopant Fluctuations in 20-nm/15-nm-Gate Planar CMOSIEEE Transactions on Electron Devices200885
A physical model for the hysteresis phenomenon of the ultrathin ZrO2 filmJournal of Applied Physics200277
An Agile VCO Frequency Calibration Technique for a 10-GHz CMOS PLLIEEE Journal of Solid-State Circuits200776
Preparation and characterization of polypropylene-graft-thermally reduced graphite oxide with an improved compatibility with polypropylene-based nanocompositeNanoscale201175
Improved three-point formulas considering the interface conditions in the finite-difference analysis of step-index optical devicesJournal of Lightwave Technology200073
A Bluetooth Low-Energy Transceiver With 3.7-mW All-Digital Transmitter, 2.75-mW High-IF Discrete-Time Receiver, and TX/RX Switchable On-Chip Matching NetworkIEEE Journal of Solid-State Circuits201772
A novel transient characterization technique to investigate trap properties in HfSiON gate dielectric MOSFETs-from single electron emission to PBTI recovery transientIEEE Transactions on Electron Devices200666