Citation of paper, Finite memory test response compactors for embedded test applications

Authors Citing This Paper

AuthorCiting PapersAuthor's PapersAuthor's CitationsAuthor's IF
Sying-Jyan Wang1431940.5
Pralhadrao V Shantagiri1460.3
Chun-Yi Lee1101171.4
Jerzy Tyszer1313401.7

Journals Citing This Paper

JournalCiting PapersJournal's IFJournal's Star
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems72.5★★★
VLSI Test Symposium (VTS), Proceedings, IEEE2
Journal of Electronic Testing: Theory and Applications (JETTA)20.7★★★
IEEE Transactions on Computers22.5★★★
IEEE International Test Conference (TC)1
IET Computers and Digital Techniques10.9★★★
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.4★★★
IT - Information Technology10.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems12.6★★★