0.4(top 23%)
Impact Factor
0.4(top 23%)
extended IF
77(top 5%)
H-Index
10.1K
authors
57.4K
papers
184.1K
citations
3.9K
citing journals
53.3K
citing authors

Most Cited Articles of Materials Science Forum

TitleYearCitations
A Rietveld-Analysis Programm RIETAN-98 and its Applications to Zeolites20001.5K
WinPLOTR: A Windows Tool for Powder Diffraction Pattern Analysis20011.3K
High-Entropy Alloys – A New Era of Exploitation2007362
Glass Forming Ability Criterion1987350
Use of the CSD Program Package for Structure Determination from Powder Data1993323
Interstitial H and {H,B}, {H,C}and {H,Si} Pairs in Si and Ge1992313
Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes2001310
Recent Developments in Magnetic Refrigeration1999299
Magnesium Alloys Development towards the 21st Century2000269
Fundamental Aspects of Bulk Metallic Glass Formation in Multicomponent Alloys1996268
Long Term Operation of 4.5kV PiN and 2.5kV JBS Diodes2001215
The Use of Functionally Graded Poly-SiGe Layers for MEMS Applications2005202
Friction Stir Processing: A New Grain Refinement Technique to Achieve High Strain Rate Superplasticity in Commercial Alloys2001199
Effects of Platinum on the Interdiffusion and Oxidation Behavior of Ni-Al-Based Alloys2004192
Recent Magnesium Alloy Development for Automotive Powertrain Applications2003186
Plasma Deposition, Properties and Structure of Amorphous Hydrogenated Carbon Films1991186
Recently-Developed Aluminium Solutions for Aerospace Applications2006176
Closure Profiles in Cooling Systems1986171
Quantitative Analysis of Silicate Glass in Ceramic Materials by the Rietveld Method1998164
Development of Large-Size Ceramic/Metal Bulk FGM Fabricated by Spark Plasma Sintering1999160
Volatility of Common Protective Oxides in High-Temperature Water Vapor: Current Understanding and Unanswered Questions2004156
N2O Processing Improves the 4H-SiC:SiO2 Interface2002150
Magnetic and Transport Properties of Metallic Multilayers1991147
Unified Formulation to Predict the Tensile Curves of Steels with Different Microstructures2003138
Interstitial Defect Reactions in Silicon1991132