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Surface and Interface Analysis
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Surface and Interface Analysis
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1.5
(top 11%)
Impact Factor
1.6
(top 11%)
extended IF
121
(top 3%)
H-Index
3.6K
authors
7.7K
papers
138K
citations
3.3K
citing journals
57.8K
citing authors
Most Cited Articles of Surface and Interface Analysis
Title
Year
Citations
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
1979
4.5K
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds
2004
2.2K
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
1994
1.9K
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
1981
1.7K
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range
1991
1.1K
X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
2009
989
Calculations of electron inelastic mean free paths for 31 materials
1988
808
Structure and physicochemistry of anodic oxide films on titanium and TA6V alloy
1999
762
Surface Oxidation and Reduction of CuO and Cu2O Studied Using XPS and XAES
1996
761
Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method
1998
676
Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)
2008
676
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
2011
647
Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50–2000 eV range
1991
575
Advanced analysis of copper X-ray photoelectron spectra
2017
561
XPS Study of the reduction of cerium dioxide
1993
477
Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments
1997
456
Resolving ruthenium: XPS studies of common ruthenium materials
2015
425
An ESCA method for determining the oxide thickness on aluminum alloys
1990
425
XPS O 1s binding energies for polymers containing hydroxyl, ether, ketone and ester groups
1991
421
X-ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides
1992
409
Quantitative analysis of the inelastic background in surface electron spectroscopy
1988
384
XPS study of supported gold catalysts: the role of Au0 and Au+δ species as active sites
2006
371
Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV
1993
360
The quantitative analysis of surfaces by XPS: A review
1980
350
Adventitious carbon—the panacea for energy referencing?
1982
338
previous
1990
1991
1992
How are inpact factors calculated?
The impact factor (IF) is calculated by counting citations from peer-reviewed journals only.
extended IF
also counts citations from books and conference papers. However, no patent, abstract, working papers, online documents, etc., are covered.
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