1.5(top 11%)
Impact Factor
1.6(top 11%)
extended IF
121(top 3%)
H-Index
3.6K
authors
7.7K
papers
138K
citations
3.3K
citing journals
57.8K
citing authors

Most Cited Articles of Surface and Interface Analysis

TitleYearCitations
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids19794.5K
Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds20042.2K
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range19941.9K
Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis19811.7K
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range19911.1K
X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems2009989
Calculations of electron inelastic mean free paths for 31 materials1988808
Structure and physicochemistry of anodic oxide films on titanium and TA6V alloy1999762
Surface Oxidation and Reduction of CuO and Cu2O Studied Using XPS and XAES1996761
Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method1998676
Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (CexTiyOz)2008676
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range2011647
Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50–2000 eV range1991575
Advanced analysis of copper X-ray photoelectron spectra2017561
XPS Study of the reduction of cerium dioxide1993477
Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments1997456
Resolving ruthenium: XPS studies of common ruthenium materials2015425
An ESCA method for determining the oxide thickness on aluminum alloys1990425
XPS O 1s binding energies for polymers containing hydroxyl, ether, ketone and ester groups1991421
X-ray photoelectron spectroscopy analysis of copper and zinc oxides and sulphides1992409
Quantitative analysis of the inelastic background in surface electron spectroscopy1988384
XPS study of supported gold catalysts: the role of Au0 and Au+δ species as active sites2006371
Calculations of electron inelastic mean free paths (IMFPS). IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV1993360
The quantitative analysis of surfaces by XPS: A review1980350
Adventitious carbon—the panacea for energy referencing?1982338