0.5(top 21%)
Impact Factor
0.5(top 21%)
extended IF
75(top 5%)
H-Index
4.8K
authors
25.4K
papers
62.9K
citations
4.3K
citing journals
35.9K
citing authors

Most Cited Articles of Microscopy and Microanalysis

TitleYearCitations
A review of strain analysis using electron backscatter diffraction2011700
Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram2000632
Morphology Control of Iron Oxide Nanoparticles2011413
Review of atom probe FIB-based specimen preparation methods2007302
Automated analysis of SEM X-ray spectral images: a powerful new microanalysis tool2003258
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit2008241
New techniques for the analysis of fine-scaled clustering phenomena within atom probe tomography (APT) data2007234
EBSD image quality mapping2006224
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy2016222
An improved cryogen for plunge freezing2008205
Vector piezoresponse force microscopy2006204
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond2019202
Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications2005188
Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy2009162
Computing Local Thickness of 3D Structures with ImageJ2007161
First data from a commercial local electrode atom probe (LEAP)2004156
Endothelial cell-pericyte interactions stimulate basement membrane matrix assembly: influence on vascular tube remodeling, maturation, and stabilization2012147
Enhancing Serial Block-Face Scanning Electron Microscopy to Enable High Resolution 3-D Nanohistology of Cells and Tissues2010146
Spatial distribution maps for atom probe tomography2007146
Advances in pulsed-laser atom probe: instrument and specimen design for optimum performance2007141
High-resolution transmission electron microscopy using negative spherical aberration2004138
Spatial resolution in atom probe tomography2010137
Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions2006134
SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position2003132
Atom probe tomography: a technique for nanoscale characterization2004130