About
Technology
Issues
FAQ
Title
Abstract
Text
Figure Captions
Table Cells
Section Titles
Keywords
Subjects
Authors
From
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1995
1990
1985
1980
1975
1970
1960
1950
1940
1930
1920
1910
1900
1850
1800
1700
1600
To
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1995
1990
1985
1980
1975
1970
1960
1950
1940
1930
1920
1910
1900
1850
1800
1700
1600
All Types
Articles
Communications
Reviews
Discussions
Case Reports
Chapters
Books
News
Editorials
Order By
Order By Year ASC
Order By Year DESC
Order By Citations ASC
Order By Citations DESC
Go
Scientometrics
Impact Factor
Discipline Ranks
H-Index
G-Index
Articles
Citations
Article Citations
Citation Distribution
Search This Journal
Overviews
Top Institutions
Top Schools
Top Authors
Prolific Authors
Top Articles
exaly
›
Journals
›
Microscopy and Microanalysis
›
Top Articles
Microscopy and Microanalysis
0.5
(top 21%)
Impact Factor
0.5
(top 21%)
extended IF
75
(top 5%)
H-Index
4.8K
authors
25.4K
papers
62.9K
citations
4.3K
citing journals
35.9K
citing authors
Most Cited Articles of Microscopy and Microanalysis
Title
Year
Citations
A review of strain analysis using electron backscatter diffraction
2011
700
Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram
2000
632
Morphology Control of Iron Oxide Nanoparticles
2011
413
Review of atom probe FIB-based specimen preparation methods
2007
302
Automated analysis of SEM X-ray spectral images: a powerful new microanalysis tool
2003
258
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit
2008
241
New techniques for the analysis of fine-scaled clustering phenomena within atom probe tomography (APT) data
2007
234
EBSD image quality mapping
2006
224
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
2016
222
An improved cryogen for plunge freezing
2008
205
Vector piezoresponse force microscopy
2006
204
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
2019
202
Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications
2005
188
Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
2009
162
Computing Local Thickness of 3D Structures with ImageJ
2007
161
First data from a commercial local electrode atom probe (LEAP)
2004
156
Endothelial cell-pericyte interactions stimulate basement membrane matrix assembly: influence on vascular tube remodeling, maturation, and stabilization
2012
147
Enhancing Serial Block-Face Scanning Electron Microscopy to Enable High Resolution 3-D Nanohistology of Cells and Tissues
2010
146
Spatial distribution maps for atom probe tomography
2007
146
Advances in pulsed-laser atom probe: instrument and specimen design for optimum performance
2007
141
High-resolution transmission electron microscopy using negative spherical aberration
2004
138
Spatial resolution in atom probe tomography
2010
137
Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions
2006
134
SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position
2003
132
Atom probe tomography: a technique for nanoscale characterization
2004
130
0
1
2
next
How are inpact factors calculated?
The impact factor (IF) is calculated by counting citations from peer-reviewed journals only.
extended IF
also counts citations from books and conference papers. However, no patent, abstract, working papers, online documents, etc., are covered.
site/software ©
exaly
; All materials licenced under
CC by-SA
.