1.7(top 10%)
Impact Factor
1.8(top 10%)
extended IF
211(top 1%)
citing journals
citing authors

Most Cited Articles of Review of Scientific Instruments

WSXM: a software for scanning probe microscopy and a tool for nanotechnology20075.9K
Modified Spin‐Echo Method for Measuring Nuclear Relaxation Times19584.4K
Calibration of atomic‐force microscope tips19933.2K
Time‐of‐Flight Mass Spectrometer with Improved Resolution19553K
Velocity map imaging of ions and electrons using electrostatic lenses: Application in photoelectron and photofragment ion imaging of molecular oxygen19972.2K
Optical trapping20041.8K
Calibration of rectangular atomic force microscope cantilevers19991.6K
Femtosecond pulse shaping using spatial light modulators20001.5K
Photoacoustic imaging in biomedicine20061.5K
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy19931.5K
Thermal conductivity measurement from 30 to 750 K: the 3ω method19901.3K
Fabry–Perot cavity pulsed Fourier transform microwave spectrometer with a pulsed nozzle particle source19811.3K
Application of Fourier Transform Spectroscopy to Magnetic Resonance19661.2K
Cavity ring‐down optical spectrometer for absorption measurements using pulsed laser sources19881.2K
On the possibilities of x‐ray phase contrast microimaging by coherent high‐energy synchrotron radiation19951.2K
Quartz crystal microbalance setup for frequency and Q‐factor measurements in gaseous and liquid environments19951.1K
Nanoelectromechanical systems20051.1K
Analysis of heat flow in layered structures for time-domain thermoreflectance2004987
Measuring ultrashort laser pulses in the time-frequency domain using frequency-resolved optical gating1997983
An Optical Fluorescence System for Quantitative Pressure Measurement in the Diamond‐Anvil Cell1973934
Transient plane source techniques for thermal conductivity and thermal diffusivity measurements of solid materials1991930
Cantilever transducers as a platform for chemical and biological sensors2004870
Invited review article: Single-photon sources and detectors2011818
Method for the calibration of atomic force microscope cantilevers1995770
Miniature diamond anvil pressure cell for single crystal x‐ray diffraction studies1974766