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| 11 | IEEE Solid-State Circuits Letters | 665 | 7.4K | 1 | 1 |
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| 16 | Reliability Physics Symposium, 2009 IEEE International | 69 | 963 | 1 | 1 |
| 17 | Power Semiconductor Devices & IC's, 2009 ISPSD 2009 21st International Symposium on | 84 | 877 | 1 | 1 |
| 18 | Compound Semiconductor Integrated Circuit Symposium (CSICS), IEEE | 51 | 514 | 1 | 1 |
| 19 | Proceedings of the IEEE European Test Workshop | 25 | 490 | 1 | 1 |
| 20 | Defect and Fault Tolerance in VLSI Systems, Proceedings of the IEEE International Symposium on | 44 | 431 | 1 | 1 |
| 21 | VLSI Design | 55 | 324 | 1 | 1 |
| 22 | Device Research Conference, IEEE Annual | 105 | 255 | 1 | 1 |
| 23 | Integrated Reliability Workshop Final Report, 2009 IRW '09 IEEE International | 49 | 180 | 1 | 1 |
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| 25 | Journal of Technology Computer Aided Design TCAD | 21 | 76 | 1 | 1 |
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| 29 | ICCAD -- IEEE/ACM International Conference on Computer-Aided Design | 1 | 6 | 1 | 1 |